The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2024

Filed:

Jun. 28, 2019
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Srinivasan Seetharaman, Milpitas, CA (US);

Sourabh Sankule, Bangalore, IN;

Piyush Girish Sagdeo, Santa Clara, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/44 (2006.01); G06F 11/20 (2006.01); G11C 29/38 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G11C 29/44 (2013.01); G06F 11/2094 (2013.01); G11C 29/38 (2013.01); G06F 2201/82 (2013.01); G11C 2029/0409 (2013.01);
Abstract

The disclosure relates in some aspects to a design for a data storage apparatus with a non-volatile memory that includes a block of memory comprising N wordlines partitioned into a first sub-block comprising a first subset of the N wordlines and a second sub-block comprising a second subset of the N wordlines different than the first subset. In some aspects, the disclosure relates to detecting a failure in a first sub-block. The second sub-block is then marked, in response to a failure detection in the first sub-block, with an initial designation as an unusable sub-block, and a test of the second sub-block is performed to determine a usability of the second sub-block. Based on the test, the second sub-block is then marked with a second designation that is one of a tested usable sub-block or a tested unusable sub-block.


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