The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2024

Filed:

May. 24, 2021
Applicant:

Atos Information Technology Gmbh, Munich, DE;

Inventor:

Wolfgang Thronicke, Salzkotten, DE;

Assignee:

BULL SAS, Les Clayes sous Bois, FR;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); B64C 39/02 (2023.01); G06T 7/73 (2017.01); B64U 101/30 (2023.01);
U.S. Cl.
CPC ...
G06T 7/0006 (2013.01); B64C 39/024 (2013.01); G06T 7/74 (2017.01); B64U 2101/30 (2023.01); G06T 2207/10032 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30184 (2013.01);
Abstract

A system () for examining an object () for errors comprises a monitoring device (), a processing module (), a capturing device () and a recognition module (). The monitoring device () is designed to monitor at least one parameter. A specified range of the parameter defines a context within which a result of a recognition of at least parts of the object () is expected. The processing module () is designed to prove whether the monitored parameter is within the specified range and in this case to trigger the capturing device () which is designed to capture input data associated with the object (). The recognition module () is pre-trained for recognizing the object () and to perform the recognition based on the input data. The recognition module () is designed to detect an error if a result of the recognition is not corresponding to the expected result.


Find Patent Forward Citations

Thronicke, Wolfgang. (2024). System and method for examining objects for errors (U.S. Patent No. 11983861). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11983861

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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