The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2024
Filed:
Feb. 27, 2018
Applicant:
Workday, Inc., Pleasanton, CA (US);
Inventors:
Manjunath Balasubramaniam, Cupertino, CA (US);
Parag Avinash Namjoshi, Foster City, CA (US);
Hamdi Jenzri, Alameda, CA (US);
Harikrishna Narayanan, Mountain View, CA (US);
Assignee:
Workday, Inc., Pleasanton, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06F 16/215 (2019.01); G06N 5/022 (2023.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06F 16/215 (2019.01); G06N 5/022 (2013.01);
Abstract
A system for validating data includes an interface and a processor. The interface is configured to receive a data set. The processor is configured to calculate a data quality metric for the data set, wherein the data quality metric is based at least in part on a data distribution metric; determine a model to build based at least in part on the data quality metric; build the model; and provide the model for use.