The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2024

Filed:

Nov. 19, 2021
Applicant:

Bank of America Corporation, Charlotte, NC (US);

Inventors:

Kadekoppa Kiran Rohithakshappa, Waxhaw, NC (US);

Amit Mishra, Chennai, IN;

Silpa Edappilly Santhosh, Chennai, IN;

Richa Soni, Chennai, IN;

Krithika Viswanathan, Chennai, IN;

Assignee:

BANK OF AMERICA CORPORATION, Charlotte, NC (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3696 (2013.01); G06N 20/00 (2019.01);
Abstract

Embodiments of the invention are directed to machine learning-based anomaly detection in program code. The system provides a machine learning (ML) anomaly detection model component structured to detect architectural flaws in program code based on processing application logs associated with technology program code and determining flow sequences between a plurality of layers of code. In particular, the system trains the machine learning (ML) anomaly detection model that is structured to (i) construct a first application layer map based on mapping each of the plurality of first classes associated with the first technology program code to one or more application layers, (ii) determine a first architecture pattern associated with the first technology program code, and (iii) determine whether the first technology program code is associated with an anti-pattern.


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