The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2024

Filed:

Sep. 29, 2020
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Roland Paterson-Jones, Kommetjie, ZA;

Warren Robert Russell, Dublin, IE;

Assignee:

AMAZON TECHNOLOGIES, INC., Seattle, WA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 9/455 (2018.01); G06F 9/54 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 9/45558 (2013.01); G06F 9/541 (2013.01);
Abstract

Disclosed are various embodiments for automated testing of systems and applications. A first computing device may be in data communication with a second computing device. The first computing device can receive a fault instruction specifying receive a fault instruction specifying a fault to inject into a virtual compute instance, parameters for the fault, a duration of the fault, and an identifier of the virtual compute instance. The first computing device can then send a command to a second computing device that hosts the virtual compute instance, wherein the command specifies at least the fault, the parameters for the fault, and the virtual compute instance. In turn, the second computing device can receive the command from the first computing device, save a pre-fault state of the virtual compute instance, and then introduce the fault into the virtual compute instance.


Find Patent Forward Citations

Quick Actions:

Paterson-Jones, Roland. (2024). Automated testing of systems and applications (U.S. Patent No. 11983100). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11983100

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…