The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2024
Filed:
Mar. 25, 2022
Gitlab B.v., Amsterdam, NL;
Julian Thome, Esch-sur-Alzette, LU;
Isaac Dawson, Yokohama, JP;
James Johnson, Sammamish, WA (US);
Zach Rice, Riverside, IL (US);
Daniel Searles, Spearfish, SD (US);
Lucas Charles, Portland, OR (US);
Mark Art, San Francisco, CA (US);
Taylor McCaslin, Bozeman, MT (US);
Thomas Woodham, Greer, SC (US);
Todd Stadelhofer, Portland, OR (US);
GitLab B.V., Amsterdam, NL;
Abstract
A system and method to adaptively generate a program model. Source code of a program to be tested for code issues, and a set of predefined patterns to be tested in the source code are received. Feature configuration data is generated by determining a set of features corresponding to the received set of predefined patterns. A set of program models is identified by selecting, for each feature in the set of features, a program model from among a plurality of program models that is optimized for the feature. A dynamic program model is built based on the identified set of program models, the dynamic program model being adapted to resolve each of the patterns included in the received set of predefined patterns. And the source code is tested for code issues by extracting from the dynamic program model instances of each of the set of predefined patterns.