The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2024
Filed:
Aug. 09, 2019
Applicant:
Nec Corporation, Tokyo, JP;
Inventor:
Takashi Konashi, Tokyo, JP;
Assignee:
NEC CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0751 (2013.01); G06F 11/0772 (2013.01);
Abstract
An abnormality detection apparatus () detects a start of a predetermined operation in a terminal (). The abnormality detection apparatus () acquires reference information () representing a reference of abnormality detection of the terminal () after the predetermined operation is started. After it is detected that the predetermined operation is started, the abnormality detection apparatus () detects abnormality of the terminal () by using the acquired reference information ().