The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2024
Filed:
Apr. 29, 2019
Siemens Aktiengesellschaft, Munich, DE;
Cheng Feng, Hangzhou, CN;
Daniel Schneegass, Beijing, CN;
Ying Qu, Beijing, CN;
Peng Wei Tian, Beijing, CN;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
A workpiece data processing method and apparatus are for accurately determining a relationship between production equipment processing parameters/ambient condition data and workpiece quality inspection results. A workpiece data method includes acquiring processing condition data, a quality attribute value and quality inspection result data of each of multiple workpieces processed by a piece of production equipment, the processing condition data of one workpiece including a processing parameter used by the production equipment when processing the workpiece and ambient condition data of the production equipment when processing the workpiece; determining a first relationship between the quality attribute value of the workpiece processed by the production equipment and the ambient condition data of the production equipment when processing the workpiece and the processing parameter of the production equipment; and determining a second relationship between the quality inspection result data and quality attribute value of the workpiece processed by the production equipment.