The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2024

Filed:

Aug. 02, 2021
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Yasutaka Serizawa, Cupertino, CA (US);

Sudhanshu Gaur, Cupertino, CA (US);

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/4155 (2006.01); G06N 20/00 (2019.01); G06V 10/70 (2022.01);
U.S. Cl.
CPC ...
G05B 19/4155 (2013.01); G06N 20/00 (2019.01); G06V 10/70 (2022.01); G05B 2219/31368 (2013.01);
Abstract

Example implementations described herein involve systems and methods that can involve extracting features from each of a plurality of time-series sensor data, the plurality of time-series sensor data associated with execution of one or more operations; clustering the extracted features into a plurality of tasks that occur from execution of the one or more operations, each of the plurality of tasks associated with a clustering identifier (ID) from the clustering; and calculating a cycle time of the cycle based on the initiation and end of the cycle recognized by referencing a cycle pattern model, wherein the cycle pattern model comprises configuration information of a cycle including a set from a plurality of the clustering IDs.


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