The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2024

Filed:

Dec. 18, 2020
Applicant:

Keyence Corporation, Osaka, JP;

Inventor:

Tetsuya Miyasaka, Osaka, JP;

Assignee:

KEYENCE CORPORATION, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/05 (2006.01); G06F 18/2413 (2023.01);
U.S. Cl.
CPC ...
G05B 19/058 (2013.01); G05B 19/056 (2013.01); G06F 18/2413 (2023.01); G05B 2219/14107 (2013.01);
Abstract

An object of the present invention is to efficiently identify an abnormal device by analyzing and classifying characteristics such as periodicity and continuity of data related to each device. A programmable logic controller collects data held by a device as a collection target out of the plurality of devices in accordance with a predetermined collection setting for each scan cycle of the user program, classifies each of the devices into one of a plurality of types on the basis of a characteristic of the collected time-series data of each of the devices, and determines a detection algorithm used in identification of the device as an abnormal device in accordance with the time-series data of the device collected by the collection section and the type of the device classified by the classification section for each of the devices.


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