The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2024
Filed:
Oct. 01, 2021
Applicant:
Meso Scale Technologies, Llc., Rockville, MD (US);
Inventors:
Ian Chamberlin, Burtonsville, MD (US);
Charles M. Clinton, Clarksburg, MD (US);
Eli N. Glezer, Del Mar, CA (US);
Bandele Jeffrey-Coker, Darnestown, MD (US);
Manish Kochar, Rockville, MD (US);
Sandor Kovacs, Middletown, DE (US);
D. T. Le, Silver Spring, MD (US);
Aaron Leimkuehler, Pittsburgh, PA (US);
George Sigal, Rockville, MD (US);
Leo Tabakin, Germantown, MD (US);
Jon Willoughby, Gaithersburg, MD (US);
Assignee:
MESO SCALE TECHNOLOGIES, LLC., Rockville, MD (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 7/36 (2021.01); G01N 21/25 (2006.01); G01N 21/64 (2006.01); G01N 35/02 (2006.01);
U.S. Cl.
CPC ...
G02B 7/36 (2013.01); G01N 21/253 (2013.01); G01N 21/6452 (2013.01); G01N 35/028 (2013.01);
Abstract
Apparatuses, systems, method, reagents, and kits for conducting assays as well as process for their preparation are described. They are particularly well suited for conducting automated analysis in a multi-well plate assay format.