The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2024
Filed:
Jun. 05, 2020
Applicant:
Delta Diagnostics B.v., Rotterdam, NL;
Inventors:
Bart Michiel De Boer, Rotterdam, NL;
Peter Johan Harmsma, Vleuten, NL;
Assignee:
Delta Diagnostics B.V., Rotterdam, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/42 (2006.01);
U.S. Cl.
CPC ...
G02B 6/4227 (2013.01); G02B 6/4222 (2013.01);
Abstract
In a method or system for interrogating an optical chip (), the optical chip () is illuminated with input light () and a spatially resolved image () of the output light () is measured from the optical chip (). The output light () is imaged together with a reflection of the input light (). For example, this can be used to establish, improve, or maintain alignment of the input light () on a sensor input port () of the optical chip (). The same detector () measures the spatially resolved image and a spectral response of the optical chip ().