The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2024
Filed:
Sep. 10, 2020
Tencent Technology (Shenzhen) Company Limited, Guangdong, CN;
Jianhua Yao, Shenzhen, CN;
Xiao Han, Shenzhen, CN;
Junzhou Huang, Shenzhen, CN;
Wei Liu, Shenzhen, CN;
Yen-Hsiang Wang, Shenzhen, CN;
De Cai, Shenzhen, CN;
TENCENT TECHNOLOGY (SHENZHEN) COMPANY LIMITED, Shenzhen, CN;
Abstract
An apparatus, method and storage medium for controlling a pathologic microscope are provided. The method includes obtaining a pathological digital image from an incident optical path of the pathologic microscope; performing artificial intelligence (AI) analysis on the pathological digital image to generate AI analysis information; and controlling an augmented reality (AR) projection component to project the AI analysis information on a microscopic field of the pathologic microscope on an outgoing optical path.