The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2024

Filed:

Sep. 30, 2020
Applicant:

Hesai Technology Co., Ltd., Shanghai, CN;

Inventors:

Xiaotong Zhou, Shanghai, CN;

Shaoqing Xiang, Shanghai, CN;

Zhaoming Zeng, Shanghai, CN;

Zhenlei Shao, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 3/08 (2006.01); G01S 7/487 (2006.01); G01S 17/89 (2020.01); G01S 7/4865 (2020.01);
U.S. Cl.
CPC ...
G01S 7/4873 (2013.01); G01S 17/89 (2013.01); G01S 7/4865 (2013.01);
Abstract

A method for processing a point cloud generated by a light detection and ranging system, includes: receiving a first measurement generated by the light detection and ranging system; retrieving a plurality of second measurements that are adjacent to the first measurement; calculating a first parameter by using distances of the first measurement and the plurality of the second measurements, the first parameter indicating a degree of continuum of the first measurement relative to the plurality of the second measurements; and determining whether the first measurement represents a measurement of noises by using the first parameter.


Find Patent Forward Citations

Loading…