The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2024
Filed:
Feb. 02, 2021
Microvision, Inc., Redmond, WA (US);
James Dean, Redmond, WA (US);
Christopher Cannon, Redmond, WA (US);
Alga Lloyd Nothern, III, Seattle, WA (US);
Joel Sandgathe, Portland, OR (US);
Microvision, Inc., Redmond, WA (US);
Abstract
The embodiments described herein provide systems and methods that can facilitate increased detector sensitivity and reliability in a scanning laser device. Specifically, the systems and methods utilize detectors with multiple sensors that are configured to receive reflections of laser light pulses from objects within a scan field. These multiple sensors are configured to receive these reflections through the same optical assembly used to scan the laser light pulses out to the scan field. Furthermore, the multiple sensors are configured to at least partially cancel the effects of back reflections from within the optical assembly itself. The cancellation of the effects of back reflections from within the optical assembly can improve the sensitivity of the detector, particularly for the detection of low energy reflections of laser pulses from within the scan field.