The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2024

Filed:

Jun. 22, 2021
Applicant:

Src, Inc., North Syracuse, NY (US);

Inventor:

Lance M. Bradstreet, Clay, NY (US);

Assignee:

SRC, Inc., North Syracuse, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/40 (2006.01); G01S 13/66 (2006.01); H01Q 3/26 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4004 (2013.01); G01S 13/66 (2013.01); H01Q 3/267 (2013.01);
Abstract

A method for calibrating a phased array including an antenna array comprising a plurality of antenna elements, comprising the steps: measuring with a probe a first antenna element pattern of a first antenna element of the plurality of antenna elements; performing a spherical near-field to far-field transformation of the first antenna element pattern; transforming the far-field first antenna element pattern to a plane-wave spectrum; back transforming the plane-wave far-field first antenna element pattern to a reference point within the near-field of the antenna array; normalizing the first antenna element pattern according to, at least, the value at the phase center of the plane-wave near-field first antenna element pattern; and calibrating the first antenna element based, at least in the part, on the normalized first antenna element pattern.


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