The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2024
Filed:
Nov. 22, 2021
National Instruments Corporation, Austin, TX (US);
Martin Obermaier, Dresden, DE;
Martin Laabs, Dresden, DE;
Dirk Plettemeier, Dresden, DE;
Marc Vanden Bossche, Bornem, BE;
Thomas Deckert, Dresden, DE;
Vincent Kotzsch, Dresden, DE;
Johannes Dietmar Herbert Lange, Dresden, DE;
National Instruments Corporation, Austin, TX (US);
Abstract
A system and method for testing devices such as integrated circuits (IC) with integrated antenna arrays configured for wireless signal reception. The method performs a calibration operation on a reference device under test (DUT). During the calibration operation, the DUT receives a series of first signals from a first far-field (FF) location and a series of array transmissions from a second near-field (NF) location using different beamforming settings, and determines therefrom a set of calibration parameters. The calibration parameters may be used by a probe antenna system (PAS) to transmit an array transmission to the DUT from the second NF location to emulate a single probe or multi-probe transmission from the first FF location.