The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2024
Filed:
Oct. 10, 2019
Applicant:
University of North Carolina Charlotte, Charlotte, NC (US);
Inventors:
Babak Parkhideh, Charlotte, NC (US);
Andreas Lauer, Charlotte, NC (US);
Assignee:
The University of North Carolina at Charlotte, Charlotte, NC (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 15/20 (2006.01); H05K 1/18 (2006.01);
U.S. Cl.
CPC ...
G01R 15/205 (2013.01); H05K 1/181 (2013.01); H05K 2201/10151 (2013.01); H05K 2201/10166 (2013.01);
Abstract
Apparatuses and methods of the present disclosure integrate a non-intrusive current sensor in the form of a current mismatch sensor into a power module having paralleled semiconductor structures or components. The current mismatch can be detected by the current sensor by monitoring a magnetic flux density between the paralleled components or devices.
Parkhideh, Babak. (2024). Systems and methods to detect and measure the current mismatch among parallel semiconductor devices (U.S. Patent No. 11982693). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11982693
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile