The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2024
Filed:
Nov. 19, 2019
Hitachi High-tech Corporation, Tokyo, JP;
Daisuke Akieda, Tokyo, JP;
Makoto Nogami, Tokyo, JP;
Iwao Suzuki, Tokyo, JP;
Masako Kawarai, Tokyo, JP;
Izumi Ogata, Tokyo, JP;
Shinya Ito, Tokyo, JP;
Hitachi High-Tech Corporation, Tokyo, JP;
Abstract
The present invention makes it possible to realize an analysis apparatus having a plurality of liquid chromatographs capable of judging separation performance and the like at the right timing and improving analysis performance early. Analysis starts and a mixed sample is prepared by adding a non-retaining ingredient to a measurement object sample and is introduced into an analysis flow path (Sto S). The mixed sample is separated into components by a separation column, the components are outputted as chromatogram data by a detector, and the analysis finishes (Sto S). Retention time and peak information are acquired from the chromatogram outputted from the detector, whether or not a measurement result is within an allowable range is judged, and the process shifts to next analysis when the measurement result is within the allowable range (Sto S). An amount of transit time tof a non-retaining ingredient shifted from an allowable value is confirmed when separation performance is outside an allowable range at step Sand a separation column replacement instruction is outputted to an output unit when fluctuation of the transit time tis within an allowable range (S, S). A device maintenance instruction is outputted to the output unit when the fluctuation is outside the allowable range at step S(S).