The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2024
Filed:
Dec. 10, 2019
Endress+hauser Flowtec Ag, Reinach, CH;
Oliver Berberig, Grenzach-Wyhlen, DE;
Jens Rautenberg, Geseke, DE;
Beat Kissling, Reinach, CH;
Sascha Grunwald, Steinen, DE;
Rudolf Braun, Ahorn, DE;
Achim Stark, Dörfles/Esbach, DE;
Klaus Beringer, Untersiemau, DE;
Stefan Rüger, Jena, DE;
Theo Gerald Hofmann, Jena, DE;
Endress+Hauser Flowtec AG, Reinach, CH;
Abstract
An ultrasound instrument for detecting a measured value of a medium includes a measurement chamber having a chamber wall and a longitudinal axis; a pair of ultrasound transducers configured to transmit ultrasound signals along a signal path between ultrasound transducers of the pair through the measurement chamber and to receive ultrasound signals, wherein the signal path includes a signal reflection on a reflection surface, wherein the chamber wall in a region of the reflection surface opposite a first chamber side is configured to prevent a reflection of an ultrasound signal on a chamber outer surface of the chamber wall in the direction of the signal path, wherein the chamber wall has, in the region of the reflection surface, a maximum wall thickness which is at least a factor of 1.5 greater than a Rayleigh wavelength, associated with a central frequency, of the ultrasound signal in the chamber wall.