The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 14, 2024
Filed:
Dec. 02, 2021
Fu Tai Hua Industry (Shenzhen) Co., Ltd., Shenzhen, CN;
Liu-Bin Hu, Shenzhen, CN;
Wei Yang, Shenzhen, CN;
Fu Tai Hua Industry (Shenzhen) Co., Ltd., Shenzhen, CN;
Abstract
A device to detect and analyze defects in a finished surface includes a supporting mechanism, a transmitting mechanism, a detecting mechanism, and a processor. The transmitting mechanism carries and transmits the product. The detecting mechanism includes a detecting frame, a light source assembly. The processor is used to connect to a first camera module and a second camera module, and preprocess the first image and the second image to obtain a detection and analysis of any defects of the front of the product.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile