The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2024

Filed:

Jan. 31, 2020
Applicant:

Xela Robotics Co., Ltd., Tokyo, JP;

Inventors:

Tito Pradhono Tomo, Tokyo, JP;

Alexander Schmitz, Tokyo, JP;

Sophon Somlor, Tokyo, JP;

Shigeki Sugano, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L 25/00 (2006.01); G01L 1/12 (2006.01); G01L 5/22 (2006.01);
U.S. Cl.
CPC ...
G01L 25/00 (2013.01); G01L 1/12 (2013.01); G01L 5/226 (2013.01);
Abstract

A detection deviceaccording to the present invention is provided with a calibration meansthat specifies a relational expression between an output value from a force sensorwhen an external force is applied and the magnitude of the external force. The relational expression contains a formula that includes a predetermined parameter and with which it is possible to calculate, according to an offset value obtained as the output value when the sensor is free of contact and not acted upon by the external force, the magnitude of the external force from the actual output value. The calibration meansis provided with a function derivation unitthat derives a function for calculating the parameter value from the offset value, and a parameter value determination unitthat uses the function to determine the parameter value. The function derivation unitgenerates the function from the output value when a known external force is applied and an offset value from a preceding step, and the parameter value determination unitcalculates the parameter value from the offset value acquired in a state in which the force sensoris disposed on a predetermined site where the external force is to be measured.


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