The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2024

Filed:

Jun. 14, 2021
Applicant:

Curt G. Joa, Inc., Sheboygan Falls, WI (US);

Inventors:

Adam D. DeNoble, De Pere, WI (US);

Jeffrey Dale Brown, Sheboygan, WI (US);

Robert E. Andrews, Falmouth, ME (US);

Gottfried Jason Hohm, Oconomowoc, WI (US);

Dennis J. Faucher, Sheboygan, WI (US);

Assignee:

CURT G. JOA, INC., Sheboygan Falls, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B65H 23/032 (2006.01); A61F 13/15 (2006.01); B65H 16/00 (2006.01); B65H 19/22 (2006.01); B65H 23/00 (2006.01); D06B 23/08 (2006.01);
U.S. Cl.
CPC ...
B65H 23/00 (2013.01); A61F 13/15772 (2013.01); D06B 23/08 (2013.01); B65H 2301/33224 (2013.01); B65H 2553/42 (2013.01); B65H 2801/57 (2013.01);
Abstract

Apparatus and methods are provided to minimize waste and improve quality and production in web processing operations. The apparatus and methods provide defect detection in deposition of acquisition material, which on current machines frequently flips and is difficult to detect when it has flipped causing manufacturers to scrap thousands of products. Using the present invention, defects are able to be detected by discerning a difference in the appearance from side to side with a vision camera, and an acquisition inverter can flip the material to a correct orientation.


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