The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2024

Filed:

Nov. 12, 2023
Applicant:

Wuhan University of Technology, Wuhan, CN;

Inventors:

Wen Liu, Wuhan, CN;

Jingxiang Qu, Wuhan, CN;

Chenjie Zhao, Wuhan, CN;

Yang Zhang, Wuhan, CN;

Yu Guo, Wuhan, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B63B 39/12 (2006.01);
U.S. Cl.
CPC ...
B63B 39/12 (2013.01);
Abstract

Disclosed is a method and device for automatic detection of vessel draft depth, which processes the image of a vessel's hull and extracts local area image blocks with vessel's water gauge scale separately to improve the pertinence of data processing and reduce the complexity of data processing; and based on a multi-task learning network model, performing data processing on local area image blocks to extract scale characters and waterline position, reducing the computational complexity of the model; finally, based on the relative positions of the scale and waterline, determining the vessel's draft depth, thus achieving automatic acquisition of the vessel's draft depth, this method greatly improves the efficiency of reading the vessel's draft depth.


Find Patent Forward Citations

Liu, Wen. (2024). Method and device for automatic detection of vessel draft depth (U.S. Patent No. 11981403). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11981403

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