The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2024
Filed:
Dec. 31, 2021
Applicant:
Logistics and Supply Chain Multitech R&d Centre Limited, Pok Fu Lam, HK;
Inventors:
Assignee:
Logistics and Supply Chain MultiTech R&D Centre Limited, Pok Fu Lam, HK;
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/11 (2023.01); G06V 10/25 (2022.01); G06V 10/771 (2022.01); H01J 61/52 (2006.01);
U.S. Cl.
CPC ...
H04N 23/11 (2023.01); G06V 10/25 (2022.01); G06V 10/771 (2022.01); H01J 61/523 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/30124 (2013.01); G06T 2207/30204 (2013.01);
Abstract
A system and method of extracting or inspecting a feature of an object using thermal imaging, and a method of inspecting an object of a garment product. The system includes a source of thermal influence arranged to heat or cool an object; an imager arranged to capture a plurality of images of the object when the object is subjected to the thermal influence; and an image processor arrange to processing the plurality of images and to distinguish a feature of interest from the other portions of the object presented on the plurality of images.