The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2024

Filed:

Sep. 21, 2021
Applicants:

SK Hynix Inc., Gyeonggi-do, KR;

Korea University Research and Business Foundation, Seoul, KR;

Inventors:

Hyun-Yong Yu, Seoul, KR;

Seung Geun Jung, Seoul, KR;

Mu Yeong Son, Seoul, KR;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/108 (2006.01); H01L 21/8234 (2006.01); H01L 29/08 (2006.01); H01L 29/36 (2006.01); H01L 29/423 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7827 (2013.01); H01L 21/823437 (2013.01); H01L 29/0847 (2013.01); H01L 29/36 (2013.01); H01L 29/4236 (2013.01);
Abstract

A semiconductor device and a method of manufacturing the same. The semiconductor device has a substrate in which recess regions are formed and semiconductor regions acting as a source region or a drain region is defined between the recess regions; a gate insulating layer disposed on an inner surface of each recess region; a recess gate disposed on the gate insulating layer in each recess region; an insulating capping layer disposed above the recess gate in each recess region; a metallic insertion layer disposed between a side surface of the recess gate and a side surface of the insulating capping layer and facing with a side surface of the source region or the drain region; and an intermediate insulating layer disposed between the metallic insertion layer and the recess gate to electrically insulate the metallic insertion layer from the recess gate.


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Yu, Hyun-Yong. (2024). Semiconductor device including recess gate structure and method of manufacturing the same (U.S. Patent No. 11978795). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11978795

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