The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2024

Filed:

Feb. 23, 2022
Applicant:

Renesas Electronics Corporation, Tokyo, JP;

Inventor:

Yoshiyuki Kawashima, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/28 (2006.01); H01L 29/423 (2006.01); H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 29/792 (2006.01);
U.S. Cl.
CPC ...
H01L 29/40117 (2019.08); H01L 29/42344 (2013.01); H01L 29/66484 (2013.01); H01L 29/66833 (2013.01); H01L 29/7832 (2013.01); H01L 29/792 (2013.01);
Abstract

A first gate electrode is formed on a semiconductor substrate via a first insulating film containing a metal element. A sidewall insulating film is formed on a side surface of the first gate electrode. A second gate electrode is formed on the semiconductor substrate via a second insulating film. The second gate electrode is formed so as to adjacent to the first gate electrode via the second insulating film. The second insulating film is made of a stacked film having a third insulating film, a fourth insulating film having a charge accumulating function, and a fifth insulating film. The third insulating film is formed on the semiconductor substrate as a result of an oxidation of a portion of the semiconductor substrate, and formed on the side surface of the first gate electrode as a result of an oxidation of the sidewall insulating film, by the thermal oxidation treatment.


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