The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2024
Filed:
Jul. 24, 2020
Applicant:
Metalenz, Inc., Boston, MA (US);
Inventors:
Robert C. Devlin, Stoneham, MA (US);
John Graff, Swampscott, MA (US);
Assignee:
Metalenz, Inc., Boston, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); G02B 1/00 (2006.01); G02B 5/18 (2006.01); G02B 27/09 (2006.01); G02B 27/42 (2006.01); H04N 23/55 (2023.01);
U.S. Cl.
CPC ...
H01L 27/14625 (2013.01); G02B 1/002 (2013.01); G02B 5/1809 (2013.01); G02B 5/1814 (2013.01); G02B 27/0944 (2013.01); G02B 27/0988 (2013.01); G02B 27/4233 (2013.01); G02B 27/4244 (2013.01); G02B 27/4294 (2013.01); H01L 27/14618 (2013.01); H01L 27/14621 (2013.01); H04N 23/55 (2023.01);
Abstract
Hybrid imaging systems incorporating conventional optical elements and metasurface elements with light sources and/or detectors, and methods of the manufacture and operation of such optical arrangements are provided. Systems and methods describe the integration of apertures with metasurface elements and refractive optics with metasurface elements in illumination sources and sensors.