The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2024
Filed:
Sep. 08, 2020
Koninklijke Philips N.v., Eindhoven, NL;
Christiaan Varekamp, Veldhoven, NL;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
An apparatus for evaluating a quality for image capture comprises a stored () for storing a model of a scene and a capture circuit () for generating virtual captured images for a camera configuration by rendering from the model. A depth generation circuit () generates model depth data from the model and a depth estimation circuit () generates estimated depth data from the virtual captured images. A first synthesis circuit () and a second synthesis circuit () generates first and second view images for test poses by processing the virtual captured images based on the model depth data or estimated depth data respectively. A reference circuit () generates reference images for the f test poses by rendering based on the model. A quality circuit () generates a quality metric based on a comparison of the first view images, the second view images, and the reference images.