The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2024
Filed:
Jul. 27, 2021
Raytheon Company, Tewksbury, MA (US);
Corey J. Collard, Plano, TX (US);
Jody D. Verret, Rockwall, TX (US);
Joseph C. Landry, Dallas, TX (US);
Raytheon Company, Tewksbury, MA (US);
Abstract
Systems, devices, methods, and computer-readable media for determining planarity in a 3D data set are provided. A method can include receiving or retrieving three-dimensional (3D) data of a geographical region, dividing the 3D data into first contiguous regions of specified first geographical dimensions, determining, for each first contiguous region of the first contiguous regions, respective measures of variation, identifying, based on the respective measures of variation, a search radius, dividing the 3D data into respective second contiguous or overlapping regions with dimensions the size of the identified search radius, and determining, based on the identified search radius, a planarity of each of the respective second contiguous or overlapping regions.