The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2024
Filed:
Sep. 15, 2021
Citibank, N.a., New York, NY (US);
Shubhanshu Gupta, Singapore, SG;
Ashish Awasthi, Singapore, SG;
Amaruvi Devanathan, Chennai, IN;
Mallapu Raghavulu Surya Prakash, Singapore, SG;
CITIBANK, N.A., New York, NY (US);
Abstract
Methods and systems identify and redact PII. A PII sensitivity detection framework includes multiple layers where each layer corresponds to a model. The framework analyzes data stored within different data tables and predicts whether a data column includes PII. The first layer corresponds to an AI model that analyzes each column metadata and predicts a first score indicative of a first likelihood of PII existence. The second layer corresponds to a rule-based model that uses various rules to determine a second score indicative of a second likelihood of PII existence for each column. The third layer corresponds to a column content model that analyzes content of each column using various natural language processing techniques to generate a third score indicative of a third likelihood of PII existence. The framework masks data presented to a user based on the scores generated via execution of one or more of the layers.