The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2024

Filed:

Jul. 28, 2022
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventors:

David Ryan Marquardt, San Francisco, CA (US);

Karthikeyan Sabhanatarajan, San Francisco, CA (US);

Steve Yu Zhang, San Francisco, CA (US);

Assignee:

SPLUNK INC., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/20 (2019.01); G06F 16/22 (2019.01); G06F 16/2453 (2019.01); G06F 16/2458 (2019.01);
U.S. Cl.
CPC ...
G06F 16/24537 (2019.01); G06F 16/2228 (2019.01); G06F 16/2477 (2019.01);
Abstract

Embodiments of the present disclosure provide techniques for using an inverted index in a pipelined search query. A field searchable data store is provided that comprises a plurality of event records, each event record comprising a time-stamped portion of raw machine data. Responsive to the reciept of an incoming search query, the search engine accesses an inverted index, wherein each entry in the inverted index comprises at least one field name, a corresponding at least one field value and a reference value associated with each field name and value pair that identifies a location in the data store where an associated event record is stored. Once the inverted index is accessed, it can be used to identify and search a subset of the plurality of event records, wherein the subset comprises one or more event records with corresponding reference values in the inverted index.


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