The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2024

Filed:

Jun. 22, 2023
Applicant:

Servicenow, Inc.;

Inventors:

Fabio Casati, Santa Clara, CA (US);

Hans Joachim Gerhard Pohle, Amsterdam, NL;

Sai Harini Chettla, Hyderabad, IN;

Manjeet Singh, Santa Clara, CA (US);

Jeroen van Gassel, Amsterdam, NL;

Kiran Sarvabhotla, Hyderabad, IN;

Assignee:

ServiceNow, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 67/50 (2022.01); G06F 11/34 (2006.01); G06F 16/28 (2019.01); H04L 67/561 (2022.01);
U.S. Cl.
CPC ...
G06F 11/3476 (2013.01); G06F 16/285 (2019.01); H04L 67/535 (2022.05); H04L 67/561 (2022.05);
Abstract

An example embodiment may involve identifying local traces of related events within a plurality of event data repositories, wherein each of the event data repositories is respectively associated with a software application; using a clustering model, assigning the local traces into clusters; determining positive rules that define when pairs of the local traces are linked to a common global trace, and negative rules that define when the pairs are linked to different global traces; linking the pairs into global traces; iteratively training a similarity model to project the local traces into a vector space such that the pairs that are linked to common global traces exhibit a greater similarity with one another than the pairs that are linked to different global traces; and based on the similarity model as trained, linking further local traces to the global traces.


Find Patent Forward Citations

Loading…