The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2024

Filed:

Apr. 30, 2019
Applicant:

Bar Ilan University, Ramat Gan, IL;

Inventors:

Zeev Zalevsky, Rosh HaAyin, IL;

Nisim Nisan Ozana, Rehovot, IL;

Assignee:

BAR ILAN UNIVERSITY, Ramat Gan, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 13/88 (2006.01); A61B 5/00 (2006.01); A61B 5/024 (2006.01); A61B 5/0507 (2021.01); A61B 5/08 (2006.01); G01S 7/41 (2006.01); G01S 13/10 (2006.01); G01S 13/50 (2006.01);
U.S. Cl.
CPC ...
G01S 13/88 (2013.01); A61B 5/0015 (2013.01); A61B 5/024 (2013.01); A61B 5/0507 (2013.01); A61B 5/08 (2013.01); A61B 5/7246 (2013.01); G01S 7/415 (2013.01); G01S 13/10 (2013.01); G01S 13/505 (2013.01);
Abstract

A system and corresponding method are described. The system comprises an RF transmission unit comprising an arrangement of one or more transmission antenna elements configured for transmitting radiation in one or more elected frequency ranges toward an inspection region; RF collection unit comprising one or more collection antenna elements configured for receiving radiation in said one or more frequency ranges from at least a portion of said inspection region; and a control system. The control system is configured for receiving and processing data on collected RF signals from the RF collection unit for determining one or more parameters on a at least one object located in said inspection region.


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