The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2024
Filed:
Dec. 17, 2020
Applicants:
National Technology & Engineering Solutions of Sandia, Llc, Albuquerque, NM (US);
Lawrence Livermore National Laboratory, Livermore, CA (US);
Inventors:
Carolyn Laura Fisher, Livermore, CA (US);
Todd Lane, Livermore, CA (US);
Kristen Leigh Reese, Chester, MA (US);
Matthias Frank, Livermore, CA (US);
Assignees:
National Technology & Engineering Solutions of Sandia, LLC, Albuquerque, NM (US);
Lawrence Livermore National Security, LLC, California, CA;
Primary Examiner:
Int. Cl.
CPC ...
G01N 30/72 (2006.01); C12N 1/12 (2006.01); G01N 1/22 (2006.01); G01N 1/40 (2006.01); G01N 30/02 (2006.01); G01N 30/06 (2006.01);
U.S. Cl.
CPC ...
G01N 30/7206 (2013.01); C12N 1/12 (2013.01); G01N 1/22 (2013.01); G01N 1/405 (2013.01); G01N 2030/025 (2013.01); G01N 2030/062 (2013.01);
Abstract
The present disclosure features methods of detecting crop damage in an algal culture. Such methods include detecting one or more carotenoids as a volatile organic compound in a sample obtained from a headspace of the algal culture.