The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2024
Filed:
Jan. 29, 2019
Shimadzu Corporation, Kyoto, JP;
Takahide Hatahori, Kyoto, JP;
Kenji Takubo, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto, JP;
Abstract
A displacement measurement deviceis provided with: a laser light sourcefor emitting laser light to a measurement area R of a measurement target object S; a focusing optical system (the beam splitter, the first reflecting mirror, the condenser lens) having a front focal point in the measurement area R and a rear focal point on a predetermined imaging surface (the detection surface); a non-focusing optical system (the beam splitter, the diffuser, the second reflecting mirror, and the condenser lens) in which light from a measurement area R of a correspondence point in the measurement area corresponding to each point of the imaging surface with respect to the focusing optical system is incident on the point of the imaging surface; and a photodetector (image sensor) configured to detect light intensity on the imaging surface for each point. Thus, corresponding to each of a large number of points in the measurement area R, main reflected light reflected at the point and reference light reflected at the surrounding range of the point are incident on each of a large number of points in the imaging surface, and the main reflected light and the reference light interfere at a large number of points in the imaging surface. Thus, an interference pattern is obtained.