The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2024

Filed:

Apr. 05, 2021
Applicants:

Tdk Corporation, Tokyo, JP;

Sae Magnetics (H.k.) Ltd., Shatin, HK;

Inventors:

Toshio Ishikawara, Tokyo, JP;

Takahiro Moriya, Tokyo, JP;

Toshihiko Oyama, Tokyo, JP;

Seiji Fukuoka, Hong Kong, HK;

Assignees:

TDK CORPORATION, Tokyo, JP;

SAE MAGNETICS (H.K.) LTD., Hong Kong, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 5/14 (2006.01);
U.S. Cl.
CPC ...
G01D 5/145 (2013.01);
Abstract

An angle detection apparatus includes a magnetic sensing element, a magnetic field generator, and a yoke. The magnetic field generator is rotatable around a rotation axis with respect to the magnetic sensing element and generates a magnetic field. The yoke is disposed in a magnetic-field influence region and is rotatable together with the magnetic field generator. The magnetic-field influence region is a region that lies between the magnetic field generator and the magnetic sensing element in a rotation axis direction along the rotation axis, and that is to be influenced by the magnetic field.


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