The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2024
Filed:
Feb. 09, 2023
Schweitzer Engineering Laboratories, Inc., Pullman, WA (US);
Derek Lautenschlager, Palouse, WA (US);
Arun Shrestha, Charlotte, NC (US);
Nishchal Sharma, Vancouver, WA (US);
Vinodev E. Rajasekaran, Pullman, WA (US);
Karthi Sellakkannu, Milpitas, CA (US);
Sajal Harmukh, Pullman, WA (US);
Schweitzer Engineering Laboratories, Inc., Pullman, WA (US);
Abstract
Systems and methods described herein monitor real-time digital data for degradation. A merging unit may measure electrical parameters in an electric power system using a sensor component and may generate a stream of digital data representing measured electrical parameters. The merging unit may transmit the stream of digital data representing measured electrical parameters and receive a plurality of data frames using an interface. A digital data degradation detection subsystem may analyze a plurality of digital metrics associated with the plurality of data frames and make a determination of whether a subset of the plurality of data frames satisfies the plurality of digital metrics, and the subset of the plurality of data frames fails at least one of the plurality of digital metrics. The merging unit may implement a response when the subset of the plurality of data frames fails at least one of the plurality of digital metrics.