The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2024

Filed:

May. 11, 2022
Applicant:

Naver Cloud Corporation, Seongnam-si, KR;

Inventors:

Choonhee Lee, Seongnam-si, KR;

Sejun Kim, Seongnam-si, KR;

Da Wun Jung, Seongnam-si, KR;

Heejin Jung, Seongnam-si, KR;

Assignee:

NAVER CLOUD CORPORATION, Seongnam-si, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 43/0817 (2022.01); G06F 18/214 (2023.01); H04L 41/0604 (2022.01); H04L 43/16 (2022.01);
U.S. Cl.
CPC ...
H04L 43/0817 (2013.01); G06F 18/2155 (2023.01); H04L 41/0627 (2013.01); H04L 43/16 (2013.01);
Abstract

An anomaly detection method includes collecting and preprocessing time series data every preset detection cycle; detecting an anomaly in time series data preprocessed for a current detection cycle using a deep learning model trained with an unsupervised learning scheme using features of time series data of a previous detection cycle; retraining the deep learning model by further using the time series data preprocessed for at least one detection cycle included in the current learning cycle; and detecting an anomaly in time series data collected and preprocessed for a detection cycle after the current learning cycle using the retrained deep learning model.


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