The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2024

Filed:

Mar. 11, 2020
Applicant:

Shenzhen Institutes of Advanced Technology, Guangdong, CN;

Inventors:

Shuqiang Wang, Guangdong, CN;

Wen Yu, Guangdong, CN;

Chenchen Xiao, Guangdong, CN;

Shengye Hu, Guangdong, CN;

Yanyan Shen, Guangdong, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06V 10/82 (2022.01); G06V 10/774 (2022.01);
U.S. Cl.
CPC ...
G06V 10/82 (2022.01); G06V 10/7747 (2022.01);
Abstract

An image feature visualization method and apparatus, and an electronic device during model training, inputs the real training data with positive samples into a mapping generator to obtain fictitious training data with negative samples. The mapping generator includes a mapping module configured to learn a key feature map that distinguishes the real training data with positive samples/negative samples, and the fictitious training data with negative samples is generated based on the real training data with positive samples and the key feature map. The training data with negative samples is input into a discriminator to obtain a discrimination result. An optimizer optimizes the mapping generator and the discriminator until training is completed. During model application, a target image that is to be processed is input into the mapping generator, and the mapper in the mapping generator extracts features of the target image.


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