The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2024
Filed:
Sep. 25, 2019
Carnegie Mellon University, Pittsburgh, PA (US);
Srinivasa Narasimhan, Pittsburgh, PA (US);
Joseph Bartels, Pittsburgh, PA (US);
William L Whittaker, Pittsburgh, PA (US);
Jian Wang, Pittsburgh, PA (US);
Carnegie Mellon University, Pittsburgh, PA (US);
Abstract
A method to dynamically and adaptively sample the depths of a scene using the principle of triangulation light curtains is described. The approach directly detects the presence or absence of obstacles (or scene points) at specified 3D lines in a scene by sampling the scene. The scene can be sampled sparsely, non-uniformly, or densely at specified regions. The depth sampling can be varied in real-time, enabling quick object discovery or detailed exploration of areas of interest. Once an object is discovered in the scene, adaptive light curtains comprising dense sampling of a region of the scene containing the object, can be used to better define the position, shape and size of the discovered object.