The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2024
Filed:
Apr. 18, 2022
General Electric Company, Schenectady, NY (US);
John Irvin Jackson, Brookfield, WI (US);
Amy Deubig, Waukesha, WI (US);
John Londt, Oconomowoc, WI (US);
Christine Carol Hammond, Waukesha, WI (US);
Scott McOlash, Wauwatosa, WI (US);
Vignesha Ramegowda, Waukesha, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
An imaging system and method acquires non-contrast images of a region of interest in a body and determines an entrance criterion based on the non-contrast images. The entrance criterion dictates conditions in which to begin acquiring contrast imaging exposures of the region of interest. An amount of a contrast agent is measured in one or more locations in the imaged body subsequent to acquiring the non-contrast images. The system and method determine that the one or more conditions of the entrance criterion are met based on the amount of the contrast agent that is measured in the imaged body, and acquire one or more contrast images of the region of interest in the imaged body responsive to determining that the one or more conditions of the entrance criterion are met.