The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2024
Filed:
Dec. 11, 2019
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Constantin Kappel, Schriesheim, DE;
Florian Fahrbach, Mannheim, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A method for determining a neural network for correcting optical aberrations includes determining one or more images that are at least partly related to an optical system or the design of an optical system. A neural network is determined on the basis of the determined one or more images in such a way that the determined neural network when applied to an image captured by the optical system outputs an image which has been corrected in relation to one or more optical aberrations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile