The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2024
Filed:
May. 28, 2021
Hon Hai Precision Industry Co., Ltd., New Taipei, TW;
Cheng-Feng Wang, Kaohsiung, TW;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A data test method, an electronic device, and a storage medium are provided. In the data test method, based on a Density-Based Spatial Clustering of Applications with Noise (DBSCAN), at least one cluster is obtained by removing discrete points in the target data and performing clustering, an calculation result is obtained by performing a regression analysis on the target data with the objective function, and parameters to be tested are verified according to the calculation result. Utilizing the data test method, objective function can be used to perform verification and residual analysis on the target data, related descriptions are be repeated here.