The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2024

Filed:

Sep. 16, 2022
Applicant:

Western Digital Technologies, Inc., San Jose, CA (US);

Inventors:

Yogendra Singh Sikarwar, Bengaluru, IN;

Prateek Kumar TR, Bengaluru, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0772 (2013.01); G06F 11/076 (2013.01); G06F 11/3037 (2013.01);
Abstract

Various processes for efficiently and effectively determining or predicting whether data stored in a non-volatile storage device is unreadable and/or unrecoverable during a read-retry process. To make the determination, different dynamic read threshold (DRT) entries of a dynamic read threshold (DRT) table are applied, in parallel, across different planes of the non-volatile storage device to determine whether the data is unreadable and/or unrecoverable.


Find Patent Forward Citations

Sikarwar, Yogendra. (2024). Predicting an unsuccessful error correction code condition using a dynamic read threshold table (U.S. Patent No. 11971775). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11971775

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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