The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2024

Filed:

Feb. 02, 2021
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Aditya Jhawar, Bangalore, IN;

Aditi Jaiswal, Bangalore, IN;

Jaitirth Anthony Jacob, Bangalore, IN;

Nikhil Sahni, Bangalore, IN;

Hakryoul Kim, Suwon-si, KR;

Jongwoo Kim, Suwon-si, KR;

Sungyong Bang, Suwon-si, KR;

Sunghun Jung, Suwon-si, KR;

Suraj Jha, Bangalore, IN;

Vaisakh Punnekkattu Chirayil Sudheesh Babu, Bangalore, IN;

Renju Chirakarotu Nair, Bangalore, IN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/406 (2006.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G05B 19/406 (2013.01); G06N 3/08 (2013.01); G05B 2219/49217 (2013.01);
Abstract

Methods and systems for ascertaining factors contributing to the temperature of a device. A method includes monitoring a plurality of parameters that are contributing to a temperature of the device. The method also includes estimating a degree of contribution of internal factors to the temperature of the device based on the monitored plurality of parameters and a battery temperature of a battery of the device. The method further includes estimating a degree of contribution of external factors to the temperature of the device, based on the monitored plurality of parameters and a battery temperature of a battery of the device. A neural network can be used for estimating the temperature of the ambience of the device and the impacts of internal and external factors on temperature of the device.


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