The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2024

Filed:

Dec. 21, 2021
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Yasushi Shiraishi, Kanagawa, JP;

Katsuto Sumi, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/24 (2006.01);
U.S. Cl.
CPC ...
G02B 21/245 (2013.01);
Abstract

An observation apparatus includes an acquisition unit that acquires positional information indicating a position of a bottom surface of a support for supporting an observation target, an imaging optical system that forms an optical image showing the observation target supported by the support on an image plane, a focus adjustment unit that adjusts a focal position of the imaging optical system based on the positional information acquired by the acquisition unit, and a control unit that performs control for matching an inclination of the image plane on which the optical image is formed to an inclination of an imaging surface of an imaging element based on the positional information acquired by the acquisition unit.


Find Patent Forward Citations

Loading…