The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2024

Filed:

Dec. 02, 2021
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Yi Jin, Singapore, SG;

KokMeng Wong, Singapore, SG;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/3183 (2006.01); G01R 31/319 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31905 (2013.01); G01R 31/318307 (2013.01); G01R 31/31912 (2013.01);
Abstract

The present disclosure provides an electronic tester comprising at least one test fixture that couples to a device under test, at least one test instrument coupled to at least one of the test fixtures that measures signals in the device under test, a test controller that controls the device under test while the test is performed, and an adapter module comprising a general control interface that is coupled to the test controller, and a DUT-specific communication interface that couples to the device under test to communicate with the device under test, wherein the test controller controls the device under test with generic control signals sent to the general control interface, and wherein the adapter module translates the general control signals into DUT-specific control signals and transmit the DUT-specific control signals to the device under test. Further, the present disclosure provides a respective method.


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