The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 30, 2024
Filed:
Mar. 20, 2019
Hitachi High-tech Corporation, Tokyo, JP;
Roche Diagnostics Operations, Inc., Indianapolis, IN (US);
Yuichi Hirabayashi, Tokyo, JP;
Dai Inagi, Tokyo, JP;
Satoshi Yokotsuka, Tokyo, JP;
Youichi Aruga, Tokyo, JP;
Mohamed Abouelsoud, Mannheim, DE;
HITACHI HIGH-TECH CORPORATION, Tokyo, JP;
ROCHE DIAGNOSTICS OPERATIONS, INC., Indianapolis, IN (US);
Abstract
An automatic analyzer is provided which is easier to investigate when some troubles such as data abnormality occur in a sample analysis result as compared with an automatic analyzer according to the related art. The automatic analyzer includes: analysis units that perform analysis and quality control analysis for ensuring quality of the analysis; a storage medium that stores quality control results of the quality control analysis performed by the analysis units; a monitor that displays the quality control results; and a control PC that controls an operation of the analysis units (and), executes, when an arbitrary result is selected from the quality control results stored in the storage medium, based on the selected quality control result, statistical calculation of the selected result and a quality control result performed in the past, and causes the monitor to display a statistical calculation screen as a statistical calculation result.