The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2024

Filed:

Jun. 09, 2021
Applicants:

Yokogawa Electric Corporation, Musashino, JP;

University of Zurich, Zurich, CH;

Inventors:

Takayuki Kei, Musashino, JP;

Yohei Tsubouchi, Musashino, JP;

Lucas Pelkmans, Zurich, CH;

Gabriele Gut, Zurich, CH;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/58 (2006.01); G01N 1/30 (2006.01);
U.S. Cl.
CPC ...
G01N 33/582 (2013.01); G01N 1/30 (2013.01);
Abstract

An analysis apparatus () includes a housing unit () that houses a biological sample (S), a staining dispenser unit () that fluorescently stains the biological sample (S), an image acquisition unit () that acquires an image of the biological sample (S), a washer unit () that destains the biological sample (S), a drive unit (), and a control unit () that analyzes the image and controls the drive unit (). The control unit () performs adjustments so that the staining dispenser unit () and the housing unit () satisfy a first position condition, performs adjustments so that the image acquisition unit () and the housing unit () satisfy a second position condition, and performs adjustments so that the washer unit () and the housing unit () satisfy a third position condition. The analysis apparatus () maximizes the actual photography range of information related to the biological sample. The analysis apparatus () can also minimize variation in the time required for processes and can achieve high-quality analysis.


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